EFEE 2019 Helsinki Finland

The European Federation of Explosives Engineer (EFEE) 2019 was held at the Scandic Marina Congress Center in Helsinki Finland from September 15-18th. Tom and Thomas Palangio had the pleasure of attending this conference and representing WipWare at Booth #44 showcasing our photoanalysis software and systems. Also in attendance at our booth was our Value Added Reseller […]

Hands-On Lab at Queen’s University

On Wednesday, August 14th, WipWare’s Value Added Retailer Technical Liaison, Marty Wanner visited Queen’s University in the beautiful city of Kingston, Ontario.  Marty worked with the Head of The Robert M. Buchan Department of Mining, Takis Katsabanis, and the Bachelor of Mining Engineering Technology students. They completed a hands-on lab that included reviewing manual sieving techniques […]

EFEE 2019 Helsinki, Finland – Last Trade Show of the Year

WipWare is looking forward to attending our last Trade Show of the year in Helsinki, Finland with our VAR (Value Added Reseller), Guido Pas with Syscom BV. Please stop by our Booth #44. We look forward to showcasing our photoanalysis systems and software. The EFEE World Conference on Explosives and Blasting has established itself as […]

Crushing it at St Marys Cement in Charlevoix

WipWare’s technical specialist was on-site at Votorantim Cimentos St Marys Cement to commission a 3-camera Momentum system.

WipFrag Training at Austin Powder hosted by Austin Powder

Our technical specialists are always available to assist our customers in understanding the capabilities of our systems and software. WipWare prides itself in providing ongoing technical support in-house and on-site. A two-day training workshop on WipWare’s WipFrag software was conducted with Hayden Materials, and host Austin Powder, in Elizabethtown, Kentucky. The WipFrag team visited a local […]

Tips for using WipFrag Fragmentation Analysis Software

When acquiring image samples each image should: Contain an easy to read scale (two for tilt correction). If using two scales, both should be horizontal. Be high definition – Not necessarily high resolution. Never be taken with a wide-angle lens. Contain clearly visible particles (if you can outline each individual particle, the software can too). Have […]